On the Efficiency of Measuring ADC Dynamic Parameters to Detect ADC Static Errors - LIRMM - Laboratoire d’Informatique, de Robotique et de Microélectronique de Montpellier
Conference Papers Year : 2003

On the Efficiency of Measuring ADC Dynamic Parameters to Detect ADC Static Errors

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Micro and nanotechnologies/Microelectronics

Christine Carvalho De Matos  : Connect in order to contact the contributor

https://hal-lirmm.ccsd.cnrs.fr/lirmm-00269498

Submitted on : Thursday, April 3, 2008-8:21:36 AM

Last modification on : Friday, March 24, 2023-2:52:50 PM

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lirmm-00269498 , version 1 (03-04-2008)

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  • HAL Id : lirmm-00269498 , version 1

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Mariane Comte, Florence Azaïs, Serge Bernard, Yves Bertrand, Michel Renovell. On the Efficiency of Measuring ADC Dynamic Parameters to Detect ADC Static Errors. LATW: Latin American Test Workshop, Feb 2003, Natal, Brazil. pp.198-203. ⟨lirmm-00269498⟩

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