Skip to Main content Skip to Navigation
Conference papers

A New Methodology for ADC Test Flow Optimization

Serge Bernard 1 Mariane Comte 1 Florence Azaïs 1 Yves Bertrand 1 Michel Renovell 1
1 SysMIC - Conception et Test de Systèmes MICroélectroniques
LIRMM - Laboratoire d'Informatique de Robotique et de Microélectronique de Montpellier
Abstract : Testing of Analog-to-Digital Converters is classically composed of two successive and independent phases: the histogram-based test technique evaluating static specifications and the spectral analysis technique evaluating the dynamic performances. Consequently, the fundamental objective here is to investigate the feasibility of an alternative test flow involving exclusively spectral analysis to replace these two time consuming and expensive phases. The viability of this solution depends on the ability of spectral analysis to detect static specifications. In this context, this paper presents a new methodology based on a statistical approach to quantitatively evaluate the efficiency of detecting static errors from dynamic parameter measurements. This methodology has been implemented in an in-house automatic tool allowing one to process any ADC specifications. It is then possible to choose a priori the best test flow for a given application considering the most adequate trade-off between test time and test efficiency.
Complete list of metadata
Contributor : Christine Carvalho de Matos <>
Submitted on : Friday, January 20, 2017 - 5:53:12 PM
Last modification on : Tuesday, January 5, 2021 - 4:00:05 PM
Long-term archiving on: : Friday, April 21, 2017 - 4:40:42 PM


Publisher files allowed on an open archive




Serge Bernard, Mariane Comte, Florence Azaïs, Yves Bertrand, Michel Renovell. A New Methodology for ADC Test Flow Optimization. ITC: International Test Conference, Sep 2003, Charlotte, NC, United States. pp.201-209, ⟨10.1109/TEST.2003.1270841⟩. ⟨lirmm-00269527⟩



Record views


Files downloads