A New Methodology for ADC Test Flow Optimization

Mariane Comte 1 Serge Bernard 1 Florence Azaïs 1 Yves Bertrand 1 Michel Renovell 1
1 SysMIC - Conception et Test de Systèmes MICroélectroniques
LIRMM - Laboratoire d'Informatique de Robotique et de Microélectronique de Montpellier
Abstract : Testing of Analog-to-Digital Converters is classically composed of two successive and independent phases: the histogram-based test technique evaluating static specifications and the spectral analysis technique evaluating the dynamic performances. Consequently, the fundamental objective here is to investigate the feasibility of an alternative test flow involving exclusively spectral analysis to replace these two time consuming and expensive phases. The viability of this solution depends on the ability of spectral analysis to detect static specifications. In this context, this paper presents a new methodology based on a statistical approach to quantitatively evaluate the efficiency of detecting static errors from dynamic parameter measurements. This methodology has been implemented in an in-house automatic tool allowing one to process any ADC specifications. It is then possible to choose a priori the best test flow for a given application considering the most adequate trade-off between test time and test efficiency.
Type de document :
Communication dans un congrès
ITC: International Test Conference, Sep 2003, Charlotte, NC, United States. pp.201-209, 2003, 〈10.1109/TEST.2003.1270841〉
Liste complète des métadonnées
https://hal-lirmm.ccsd.cnrs.fr/lirmm-00269527
Contributeur : Christine Carvalho de Matos <>
Soumis le : vendredi 20 janvier 2017 - 17:53:12
Dernière modification le : vendredi 20 juillet 2018 - 12:34:01
Document(s) archivé(s) le : vendredi 21 avril 2017 - 16:40:42

Fichier

ETW.pdf
Fichiers éditeurs autorisés sur une archive ouverte

Identifiants

Collections

LIRMM | SYSMIC | LIRMM_MIC | MIC | MIPS | UNIV-MONTPELLIER

Citation

Mariane Comte, Serge Bernard, Florence Azaïs, Yves Bertrand, Michel Renovell. A New Methodology for ADC Test Flow Optimization. ITC: International Test Conference, Sep 2003, Charlotte, NC, United States. pp.201-209, 2003, 〈10.1109/TEST.2003.1270841〉. 〈lirmm-00269527〉

Exporter

BibTeX TEI DC DCterms EndNote

Partager

Métriques

Consultations de la notice

237

Téléchargements de fichiers

255

Contact

support.ccsd.cnrs.fr
hal.support@ccsd.cnrs.fr
Logo CCSD