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Conference papers

An Automatic Tool for Generation of ADC BIST Architecture

Serge Bernard 1 Florence Azaïs 1 Mariane Comte 1 Yves Bertrand 1 Michel Renovell 1 
1 SysMIC - Conception et Test de Systèmes MICroélectroniques
LIRMM - Laboratoire d'Informatique de Robotique et de Microélectronique de Montpellier
Keywords : HISTOGRAM-BASED TEST BIST
Document type :
Conference papers
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https://hal-lirmm.ccsd.cnrs.fr/lirmm-00269580
Contributor : Christine Carvalho De Matos Connect in order to contact the contributor
Submitted on : Thursday, April 3, 2008 - 8:21:53 AM
Last modification on : Friday, August 5, 2022 - 10:48:13 AM

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  • HAL Id : lirmm-00269580, version 1

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CNRS | SYSMIC | LIRMM | LIRMM_MIC | MIC | MIPS | UNIV-MONTPELLIER

Citation

Serge Bernard, Florence Azaïs, Mariane Comte, Yves Bertrand, Michel Renovell. An Automatic Tool for Generation of ADC BIST Architecture. IMSTW: International Mixed-Signal Testing Workshop, Jun 2003, Sevilla, Spain. pp.79-84. ⟨lirmm-00269580⟩

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