Skip to Main content Skip to Navigation
Conference papers

GOSMOS: A Gate Oxide Short Defect Embedded in a MOS Compact Model

Complete list of metadatas

https://hal-lirmm.ccsd.cnrs.fr/lirmm-00269604
Contributor : Christine Carvalho de Matos <>
Submitted on : Thursday, April 3, 2008 - 8:21:57 AM
Last modification on : Friday, July 20, 2018 - 12:34:01 PM

Identifiers

  • HAL Id : lirmm-00269604, version 1

Citation

Michel Renovell, Jean-Marc Galliere, Florence Azaïs, Yves Bertrand, Jean-Michel Portal, et al.. GOSMOS: A Gate Oxide Short Defect Embedded in a MOS Compact Model. LATW: Latin American Test Workshop, Feb 2003, Natal, Brazil. ⟨lirmm-00269604⟩

Share

Metrics

Record views

217