GOSMOS: A Gate Oxide Short Defect Embedded in a MOS Compact Model - LIRMM - Laboratoire d’Informatique, de Robotique et de Microélectronique de Montpellier Access content directly
Conference Papers Year : 2003

GOSMOS: A Gate Oxide Short Defect Embedded in a MOS Compact Model

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lirmm-00269604 , version 1 (03-04-2008)

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  • HAL Id : lirmm-00269604 , version 1

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Michel Renovell, Jean-Marc J.-M. Galliere, Florence Azaïs, Yves Bertrand, Jean-Michel Portal, et al.. GOSMOS: A Gate Oxide Short Defect Embedded in a MOS Compact Model. LATW: Latin American Test Workshop, Feb 2003, Natal, Brazil. ⟨lirmm-00269604⟩
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