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GOSMOS: A Gate Oxide Short Defect Embedded in a MOS Compact Model

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https://hal-lirmm.ccsd.cnrs.fr/lirmm-00269604
Contributor : Christine Carvalho De Matos Connect in order to contact the contributor
Submitted on : Thursday, April 3, 2008 - 8:21:57 AM
Last modification on : Friday, August 5, 2022 - 10:48:09 AM

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  • HAL Id : lirmm-00269604, version 1

Citation

Michel Renovell, Jean-Marc J.-M. Galliere, Florence Azaïs, Yves Bertrand, Jean-Michel Portal, et al.. GOSMOS: A Gate Oxide Short Defect Embedded in a MOS Compact Model. LATW: Latin American Test Workshop, Feb 2003, Natal, Brazil. ⟨lirmm-00269604⟩

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