GOSMOS: A Gate Oxide Short Defect Embedded in a MOS Compact Model - LIRMM - Laboratoire d’Informatique, de Robotique et de Microélectronique de Montpellier
Conference Papers Year : 2003

GOSMOS: A Gate Oxide Short Defect Embedded in a MOS Compact Model

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Micro and nanotechnologies/Microelectronics

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https://hal-lirmm.ccsd.cnrs.fr/lirmm-00269604

Submitted on : Thursday, April 3, 2008-8:21:57 AM

Last modification on : Monday, June 10, 2024-4:58:03 PM

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lirmm-00269604 , version 1 (03-04-2008)

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  • HAL Id : lirmm-00269604 , version 1

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Michel Renovell, Jean-Marc J.-M. Galliere, Florence Azaïs, Yves Bertrand, Jean-Michel Portal, et al.. GOSMOS: A Gate Oxide Short Defect Embedded in a MOS Compact Model. LATW: Latin American Test Workshop, Feb 2003, Natal, Brazil. ⟨lirmm-00269604⟩

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