Efficient Scan Chain Design for Power Minimization During Scan Testing Under Routing Constraint

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https://hal-lirmm.ccsd.cnrs.fr/lirmm-00269609
Contributor : Christine Carvalho de Matos <>
Submitted on : Thursday, April 3, 2008 - 8:21:59 AM
Last modification on : Wednesday, August 28, 2019 - 3:46:02 PM

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Yannick Bonhomme, Patrick Girard, Loïs Guiller, Christian Landrault, Serge Pravossoudovitch. Efficient Scan Chain Design for Power Minimization During Scan Testing Under Routing Constraint. ITC: International Test Conference, Sep 2003, Charlotte, NC, United States. pp.488-493, ⟨10.1109/TEST.2003.1270874⟩. ⟨lirmm-00269609⟩

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