Automatic Generation of LH-BIST Architecture for ADC Testing - LIRMM - Laboratoire d’Informatique, de Robotique et de Microélectronique de Montpellier
Conference Papers Year : 2003

Automatic Generation of LH-BIST Architecture for ADC Testing

Christine Carvalho De Matos  : Connect in order to contact the contributor

https://hal-lirmm.ccsd.cnrs.fr/lirmm-00269683

Submitted on : Thursday, April 3, 2008-8:22:14 AM

Last modification on : Friday, March 24, 2023-2:52:50 PM

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lirmm-00269683 , version 1 (03-04-2008)

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  • HAL Id : lirmm-00269683 , version 1

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Serge Bernard, Florence Azaïs, Mariane Comte, Yves Bertrand, Michel Renovell. Automatic Generation of LH-BIST Architecture for ADC Testing. IWADC'03: IEEE International Workshop on ADC Modelling and Testing, Sep 2003, Perugia, Italy. pp.7-12. ⟨lirmm-00269683⟩

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