Journal Articles
IEEE Design & Test
Year : 2003
Christine Carvalho De Matos : Connect in order to contact the contributor
https://hal-lirmm.ccsd.cnrs.fr/lirmm-00269822
Submitted on : Thursday, April 3, 2008-8:22:54 AM
Last modification on : Friday, March 24, 2023-2:52:50 PM
Cite
Florence Azaïs, Yves Bertrand, Michel Renovell, André Ivanov, Sassan Tabatabaei. An All-Digital DFT Scheme for Testing Catastrophic Faults in PLLs. IEEE Design & Test, 2003, 20 (1), pp.60-67. ⟨10.1109/MDT.2003.1173054⟩. ⟨lirmm-00269822⟩
61
View
0
Download