Parasitic Influence, on Signal Integrity, of Several Victim Lines Placed Asymmetrically Beside and Symmetrically at Both Sides of an Attacker Interconnect and Mutually

Freddy Ponchel; Jean-François Legier; Erick Paleczny; Christophe Seguinot; Denis Deschacht

Parasitic Influence, on Signal Integrity, of Several Victim Lines Placed Asymmetrically Beside and Symmetrically at Both Sides of an Attacker Interconnect and Mutually

Freddy Ponchel ¹ Jean-François Legier ¹ Erick Paleczny ¹ Christophe Seguinot ¹ Denis Deschacht ²

1 IEMN - Institut d’Électronique, de Microélectronique et de Nanotechnologie (IEMN) - UMR 8520

2 SysMIC - Conception et Test de Systèmes MICroélectroniques

LIRMM - Laboratoire d'Informatique de Robotique et de Microélectronique de Montpellier

Type de document :

Communication dans un congrès

12th IEEE Workshop on Signal Propagation on Interconnects, May 2008, Avignon, France. IEEE, pp.N/A, 2008

Domaine :

Sciences de l'ingénieur [physics] / Micro et nanotechnologies/Microélectronique

Liste complète des métadonnées

https://hal-lirmm.ccsd.cnrs.fr/lirmm-00280536
Contributeur : Martine Peridier <>
Soumis le : lundi 19 mai 2008 - 11:37:45
Dernière modification le : samedi 13 octobre 2018 - 01:03:56

Parasitic Influence, on Signal Integrity, of Several Victim Lines Placed Asymmetrically Beside and Symmetrically at Both Sides of an Attacker Interconnect and Mutually

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Parasitic Influence, on Signal Integrity, of Several Victim Lines Placed Asymmetrically Beside and Symmetrically at Both Sides of an Attacker Interconnect and Mutually

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132

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