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Observability of Stuck-at-Faults with Differential Power Analysis

Giorgio Di Natale 1 Marie-Lise Flottes 1 Bruno Rouzeyre 1
1 SysMIC - Conception et Test de Systèmes MICroélectroniques
LIRMM - Laboratoire d'Informatique de Robotique et de Microélectronique de Montpellier
Abstract : In this paper we propose an innovative method to test integrated circuits based on the use of Differential Power Analysis. We will show that this technique, classically used to perform attacks on cryptographic devices, is very effective in observing single stuck-at faults. Based on the observation of the current consumed by the circuit during net transitions, it does not require observing primary outputs of the circuit and allows the test of hard-to-observe faults. Conversely to Iddq, this technique is not sensible to process variation.
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Contributor : Giorgio Di Natale <>
Submitted on : Friday, July 11, 2008 - 3:50:34 PM
Last modification on : Tuesday, September 1, 2020 - 11:32:04 AM
Long-term archiving on: : Friday, May 28, 2010 - 11:51:04 PM


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  • HAL Id : lirmm-00295498, version 1



Giorgio Di Natale, Marie-Lise Flottes, Bruno Rouzeyre. Observability of Stuck-at-Faults with Differential Power Analysis. LATW'08: IEEE Latin American Test Workshop, Feb 2008, Mexico. pp.N/A. ⟨lirmm-00295498⟩



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