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Yield Improvement, Fault-Tolerance to the Rescue?

Abstract : With the technology entering the nano dimension, manufacturing processes are less and less reliable, thus drastically impacting the yield. A possible solution to alleviate this problem in the future could consist in using fault tolerant architectures to tolerate manufacturing defects. In this paper, we analyze the conditions that make the use of a classical Triple Modular Redundancy (TMR) architecture interesting for a yield improvement purpose.
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https://hal-lirmm.ccsd.cnrs.fr/lirmm-00303400
Contributor : Martine Peridier <>
Submitted on : Tuesday, July 22, 2008 - 9:23:22 AM
Last modification on : Wednesday, August 28, 2019 - 3:46:01 PM
Document(s) archivé(s) le : Monday, May 31, 2010 - 9:01:59 PM

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Julien Vial, Alberto Bosio, Patrick Girard, Christian Landrault, Serge Pravossoudovitch, et al.. Yield Improvement, Fault-Tolerance to the Rescue?. IOLTS: International On-Line Testing Symposium, Jul 2008, Rhodes, Greece. pp.165-170, ⟨10.1109/IOLTS.2008.10⟩. ⟨lirmm-00303400⟩

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