DDECS'07: IEEE Workshop on Design and Diagnostics of Electronic Circuits and Systems - LIRMM - Laboratoire d’Informatique, de Robotique et de Microélectronique de Montpellier
Books Year : 2007

DDECS'07: IEEE Workshop on Design and Diagnostics of Electronic Circuits and Systems

Keywords

Test Diagnostic Design

Domains

Micro and nanotechnologies/Microelectronics

Patrick Girard  : Connect in order to contact the contributor

https://hal-lirmm.ccsd.cnrs.fr/lirmm-00326801

Submitted on : Monday, October 6, 2008-9:00:31 AM

Last modification on : Friday, August 11, 2023-2:26:04 PM

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Dates and versions

lirmm-00326801 , version 1 (06-10-2008)

Identifiers

  • HAL Id : lirmm-00326801 , version 1

Cite

Patrick Girard, Elena Gramatova, Adam Pawlak, Andrezw Krasniewski, Tomasz Garbolino. DDECS'07: IEEE Workshop on Design and Diagnostics of Electronic Circuits and Systems. IEEE Computer Society, pp.300, 2007, 1-4244-1161-0. ⟨lirmm-00326801⟩

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