13th IEEE European Test Symposium (ETS'08) - LIRMM - Laboratoire d’Informatique, de Robotique et de Microélectronique de Montpellier
Books Year : 2008

13th IEEE European Test Symposium (ETS'08)

Keywords

Test

Domains

Micro and nanotechnologies/Microelectronics

Patrick Girard  : Connect in order to contact the contributor

https://hal-lirmm.ccsd.cnrs.fr/lirmm-00326806

Submitted on : Monday, October 6, 2008-9:24:47 AM

Last modification on : Thursday, December 14, 2023-1:56:06 PM

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Dates and versions

lirmm-00326806 , version 1 (06-10-2008)

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  • HAL Id : lirmm-00326806 , version 1

Cite

Patrick Girard, Matteo Sonza Reorda, Zebo Peng, Christian Landrault, Cecilia Metra (Dir.). 13th IEEE European Test Symposium (ETS'08). IEEE Computer Society, pp.250, 2008, 978-0-7695-3150-2. ⟨lirmm-00326806⟩

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CNRS SYSMIC LIRMM LIRMM_MIC MIC MIPS UNIV-MONTPELLIER
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