Deriving an Electrical Model for Delay Faults Caused by Crosstalk Aggravated Resistive Short Defects - LIRMM - Laboratoire d’Informatique, de Robotique et de Microélectronique de Montpellier Access content directly
Conference Papers Year : 2009
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lirmm-00367708 , version 1 (12-03-2009)

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  • HAL Id : lirmm-00367708 , version 1

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Nicolas Houarche, Alejandro Czutro, Mariane Comte, Piet Engelke, Ilia Polian, et al.. Deriving an Electrical Model for Delay Faults Caused by Crosstalk Aggravated Resistive Short Defects. LATW'09: 10th Latin-American Test Workshop, Mar 2009, Armaçao dos Buzios, Brazil, pp.N/A. ⟨lirmm-00367708⟩
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