Skip to Main content Skip to Navigation
Conference papers

Deriving an Electrical Model for Delay Faults Caused by Crosstalk Aggravated Resistive Short Defects

Complete list of metadatas

https://hal-lirmm.ccsd.cnrs.fr/lirmm-00367708
Contributor : Martine Peridier <>
Submitted on : Thursday, March 12, 2009 - 10:59:04 AM
Last modification on : Friday, July 20, 2018 - 12:34:01 PM

Identifiers

  • HAL Id : lirmm-00367708, version 1

Collections

Citation

Nicolas Houarche, Alejandro Czutro, Mariane Comte, Piet Engelke, Ilia Polian, et al.. Deriving an Electrical Model for Delay Faults Caused by Crosstalk Aggravated Resistive Short Defects. LATW'09: 10th Latin-American Test Workshop, Mar 2009, Armaçao dos Buzios, Brazil, pp.N/A. ⟨lirmm-00367708⟩

Share

Metrics

Record views

399