Conference Papers
Year : 2009
Martine Peridier : Connect in order to contact the contributor
https://hal-lirmm.ccsd.cnrs.fr/lirmm-00367708
Submitted on : Thursday, March 12, 2009-10:59:04 AM
Last modification on : Monday, September 23, 2024-10:28:03 AM
Dates and versions
Identifiers
- HAL Id : lirmm-00367708 , version 1
Cite
Nicolas Houarche, Alejandro Czutro, Mariane Comte, Piet Engelke, Ilia Polian, et al.. Deriving an Electrical Model for Delay Faults Caused by Crosstalk Aggravated Resistive Short Defects. LATW'09: 10th Latin-American Test Workshop, Mar 2009, Armaçao dos Buzios, Brazil, pp.N/A. ⟨lirmm-00367708⟩
213
View
0
Download