Deriving an Electrical Model for Delay Faults Caused by Crosstalk Aggravated Resistive Short Defects - LIRMM - Laboratoire d’Informatique, de Robotique et de Microélectronique de Montpellier
Conference Papers Year : 2009

Deriving an Electrical Model for Delay Faults Caused by Crosstalk Aggravated Resistive Short Defects

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Micro and nanotechnologies/Microelectronics

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https://hal-lirmm.ccsd.cnrs.fr/lirmm-00367708

Submitted on : Thursday, March 12, 2009-10:59:04 AM

Last modification on : Monday, September 23, 2024-10:28:03 AM

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lirmm-00367708 , version 1 (12-03-2009)

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  • HAL Id : lirmm-00367708 , version 1

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Nicolas Houarche, Alejandro Czutro, Mariane Comte, Piet Engelke, Ilia Polian, et al.. Deriving an Electrical Model for Delay Faults Caused by Crosstalk Aggravated Resistive Short Defects. LATW'09: 10th Latin-American Test Workshop, Mar 2009, Armaçao dos Buzios, Brazil, pp.N/A. ⟨lirmm-00367708⟩

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