Advanced Test Methods for SRAMs - Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies - LIRMM - Laboratoire d’Informatique, de Robotique et de Microélectronique de Montpellier Access content directly
Books Year : 2009

Advanced Test Methods for SRAMs - Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies

Domains

Micro and nanotechnologies/Microelectronics

Martine Peridier  : Connect in order to contact the contributor

https://hal-lirmm.ccsd.cnrs.fr/lirmm-00371359

Submitted on : Friday, March 27, 2009-3:28:54 PM

Last modification on : Friday, March 24, 2023-2:52:51 PM

No file

Dates and versions

lirmm-00371359 , version 1 (27-03-2009)

Identifiers

  • HAL Id : lirmm-00371359 , version 1

Cite

Alberto Bosio, Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel. Advanced Test Methods for SRAMs - Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies. Springer, 171 p., 2009, 978-1-4419-0937-4. ⟨lirmm-00371359⟩

Export

BibTeX XML-TEI Dublin Core DC Terms EndNote DataCite

Collections

CNRS SYSMIC LIRMM LIRMM_MIC MIC MIPS UNIV-MONTPELLIER EC_LYON_STRICT
87 View
0 Download

Share

Gmail Mastodon Facebook X LinkedIn More