Books
Year : 2009
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https://hal-lirmm.ccsd.cnrs.fr/lirmm-00371359
Submitted on : Friday, March 27, 2009-3:28:54 PM
Last modification on : Friday, March 24, 2023-2:52:51 PM
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- HAL Id : lirmm-00371359 , version 1
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Alberto Bosio, Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel. Advanced Test Methods for SRAMs - Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies. Springer, 171 p., 2009, 978-1-4419-0937-4. ⟨lirmm-00371359⟩
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