Advanced Test Methods for SRAMs - Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies - LIRMM - Laboratoire d’Informatique, de Robotique et de Microélectronique de Montpellier Access content directly
Books Year : 2009

Advanced Test Methods for SRAMs - Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies

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lirmm-00371359 , version 1 (27-03-2009)

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  • HAL Id : lirmm-00371359 , version 1

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Alberto Bosio, Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel. Advanced Test Methods for SRAMs - Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies. Springer, 171 p., 2009, 978-1-4419-0937-4. ⟨lirmm-00371359⟩
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