An Electrical Model for the Fault Simulation of Small Delay Faults Caused by Crosstalk Aggravated Resistive Short Defects - LIRMM - Laboratoire d’Informatique, de Robotique et de Microélectronique de Montpellier Access content directly
Conference Papers Year : 2009

An Electrical Model for the Fault Simulation of Small Delay Faults Caused by Crosstalk Aggravated Resistive Short Defects

Abstract

In this paper a new electrical model is proposed to be used in fault size based fault simulation of crosstalk aggravated resistive short defects. The electrical behavior of the defect is first described and analyzed in details. Then an electrical model is proposed allowing to efficiently compute the critical resistance determining the range of detectable short resistance. The model is validated by comparison with SPICE simulations.
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Dates and versions

lirmm-00374941 , version 1 (10-04-2009)

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Nicolas Houarche, Mariane Comte, Michel Renovell, Alejandro Czutro, Piet Engelke, et al.. An Electrical Model for the Fault Simulation of Small Delay Faults Caused by Crosstalk Aggravated Resistive Short Defects. VTS'09: 27th VLSI Test Symposium, May 2009, Santa Cruz, Californie, United States. pp.21-26, ⟨10.1109/VTS.2009.57⟩. ⟨lirmm-00374941⟩
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