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Near-field Mapping System to Scan in Time Domain the Magnetic Emissions of Integrated Circuits

Abstract : This paper introduces a low cost near-field mapping system. This system scans automatically and dynamically, in the time domain, the magnetic field emitted by integrated circuits during the execution of a repetitive set of instructions. Application of this measurement system is given to an industrial chip designed with a 180nm CMOS process. This application demonstrates the efficiency of the system but also the helpfulness of the results obtained to identify paths followed by the current and to locate the potential IR drop zones.
keyword : EM emissions
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https://hal-lirmm.ccsd.cnrs.fr/lirmm-00394395
Contributor : Philippe Maurine <>
Submitted on : Thursday, June 11, 2009 - 3:16:10 PM
Last modification on : Thursday, September 17, 2020 - 10:40:38 AM
Long-term archiving on: : Friday, June 11, 2010 - 12:37:26 AM

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Thomas Ordas, Mathieu Lisart, Etienne Sicard, Philippe Maurine, Lionel Torres. Near-field Mapping System to Scan in Time Domain the Magnetic Emissions of Integrated Circuits. PATMOS: Power and Timing Modeling Optimization and Simulation, Sep 2008, Lisbon, Portugal. pp.229-236, ⟨10.1007/978-3-540-95948-9_23⟩. ⟨lirmm-00394395⟩

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