Near-field Mapping System to Scan in Time Domain the Magnetic Emissions of Integrated Circuits - LIRMM - Laboratoire d’Informatique, de Robotique et de Microélectronique de Montpellier Access content directly
Conference Papers Year : 2008

Near-field Mapping System to Scan in Time Domain the Magnetic Emissions of Integrated Circuits

Abstract

This paper introduces a low cost near-field mapping system. This system scans automatically and dynamically, in the time domain, the magnetic field emitted by integrated circuits during the execution of a repetitive set of instructions. Application of this measurement system is given to an industrial chip designed with a 180nm CMOS process. This application demonstrates the efficiency of the system but also the helpfulness of the results obtained to identify paths followed by the current and to locate the potential IR drop zones.

Keywords

Fichier principal
Vignette du fichier
TimeDomainNearfieldMappingSystem.pdf (382.41 Ko) Télécharger le fichier
Origin : Files produced by the author(s)
Loading...

Dates and versions

lirmm-00394395 , version 1 (11-06-2009)

Identifiers

Cite

Thomas Ordas, Mathieu Lisart, Etienne Sicard, Philippe Maurine, Lionel Torres. Near-field Mapping System to Scan in Time Domain the Magnetic Emissions of Integrated Circuits. PATMOS: Power and Timing Modeling Optimization and Simulation, Sep 2008, Lisbon, Portugal. pp.229-236, ⟨10.1007/978-3-540-95948-9_23⟩. ⟨lirmm-00394395⟩
246 View
630 Download

Altmetric

Share

Gmail Facebook X LinkedIn More