I. Emc and T. Force, IEC61967-3 : Integrated circuits, measurement of electromagnetic emissions, 150 kHz to 1 GHz -part 3: Measurement of radiated emissions -surface scan method, IEC, 2005.

J. J. Laurin, S. G. Zaky, and K. G. Balmain, EMI-induced failures in crystal oscillators, IEEE Transactions on Electromagnetic Compatibility, vol.33, issue.4, pp.334-342, 1991.
DOI : 10.1109/15.99115

A. Boyer, S. B. Dhia, and E. Sicard, Characterisation of electromagnetic susceptibility of integrated circuits using near-field scan, Electronics Letters, vol.43, issue.1, pp.15-16, 2007.
DOI : 10.1049/el:20073130

B. Vrignon, S. B. Dhia, E. Lamoureux, and E. Sicard, Characterization and Modeling of Parasitic Emission in Deep Submicron CMOS, IEEE Transactions on Electromagnetic Compatibility, vol.47, issue.2, pp.382-387, 2005.
DOI : 10.1109/TEMC.2005.847408

A. Alaeldine, N. Lacrampe, J. L. Levant, R. Perdriau, M. Ramdani et al., Efficiency of Embedded On-Chip EMI Protections to Continuous Harmonic and Fast Transient Pulses with Respect to Substrate Injection, 2007 IEEE International Symposium on Electromagnetic Compatibility, 2007.
DOI : 10.1109/ISEMC.2007.161

URL : https://hal.archives-ouvertes.fr/hal-00239403

I. Emc and T. Force, IEC62228 : Integrated circuits -EMC evaluation of CAN transceivers, IEC, 2007.