IEC61967-3 : Integrated circuits, measurement of electromagnetic emissions, 150 kHz to 1 GHz -part 3: Measurement of radiated emissions -surface scan method, IEC, 2005. ,
EMI-induced failures in crystal oscillators, IEEE Transactions on Electromagnetic Compatibility, vol.33, issue.4, pp.334-342, 1991. ,
DOI : 10.1109/15.99115
Characterisation of electromagnetic susceptibility of integrated circuits using near-field scan, Electronics Letters, vol.43, issue.1, pp.15-16, 2007. ,
DOI : 10.1049/el:20073130
Characterization and Modeling of Parasitic Emission in Deep Submicron CMOS, IEEE Transactions on Electromagnetic Compatibility, vol.47, issue.2, pp.382-387, 2005. ,
DOI : 10.1109/TEMC.2005.847408
Efficiency of Embedded On-Chip EMI Protections to Continuous Harmonic and Fast Transient Pulses with Respect to Substrate Injection, 2007 IEEE International Symposium on Electromagnetic Compatibility, 2007. ,
DOI : 10.1109/ISEMC.2007.161
URL : https://hal.archives-ouvertes.fr/hal-00239403
IEC62228 : Integrated circuits -EMC evaluation of CAN transceivers, IEC, 2007. ,