Conference Papers
Year : 2005
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https://hal-lirmm.ccsd.cnrs.fr/lirmm-00406781
Submitted on : Thursday, July 23, 2009-2:18:08 PM
Last modification on : Friday, March 24, 2023-2:52:52 PM
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- HAL Id : lirmm-00406781 , version 1
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Pascal Nouet. Challenges in Manufacturing Test of Micro and Nano-Systems. The Innovative Manufacturing Research Conference, Scottish Manufacturing Institute, France. ⟨lirmm-00406781⟩
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