Challenges in Manufacturing Test of Micro and Nano-Systems - LIRMM - Laboratoire d’Informatique, de Robotique et de Microélectronique de Montpellier
Conference Papers Year : 2006

Challenges in Manufacturing Test of Micro and Nano-Systems

Pascal Nouet
Conception et Test de Systèmes MICroélectroniques
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Micro and nanotechnologies/Microelectronics

Lionel Torres  : Connect in order to contact the contributor

https://hal-lirmm.ccsd.cnrs.fr/lirmm-00406837

Submitted on : Thursday, July 23, 2009-3:47:27 PM

Last modification on : Friday, March 24, 2023-2:52:52 PM

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lirmm-00406837 , version 1 (23-07-2009)

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  • HAL Id : lirmm-00406837 , version 1

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Pascal Nouet. Challenges in Manufacturing Test of Micro and Nano-Systems. Workshop on Design for Reliability and Manufacturability in MNT, France. ⟨lirmm-00406837⟩

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