Conference Papers
Year : 2007
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https://hal-lirmm.ccsd.cnrs.fr/lirmm-00406909
Submitted on : Thursday, July 23, 2009-4:00:09 PM
Last modification on : Friday, March 24, 2023-2:52:52 PM
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- HAL Id : lirmm-00406909 , version 1
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Pascal Nouet. The future of Embedded Test within the Design for Micro & Nano Manufacture NoE. Workshop on Design for Reliability and Manufacturability in MNT, Apr 2006, Stresa, Lago Maggiore, Italy. ⟨lirmm-00406909⟩
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