Challenges in MEMS Manufacture Testing and Embedded Test Solutions - LIRMM - Laboratoire d’Informatique, de Robotique et de Microélectronique de Montpellier
Conference Papers Year : 2007

Challenges in MEMS Manufacture Testing and Embedded Test Solutions

Pascal Nouet
Conception et Test de Systèmes MICroélectroniques
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Micro and nanotechnologies/Microelectronics

Lionel Torres  : Connect in order to contact the contributor

https://hal-lirmm.ccsd.cnrs.fr/lirmm-00406914

Submitted on : Thursday, July 23, 2009-4:06:39 PM

Last modification on : Friday, March 24, 2023-2:52:52 PM

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lirmm-00406914 , version 1 (23-07-2009)

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  • HAL Id : lirmm-00406914 , version 1

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Pascal Nouet. Challenges in MEMS Manufacture Testing and Embedded Test Solutions. NTC (Northern Test Center) Remote and Embedded Testing Seminar, Finland. ⟨lirmm-00406914⟩

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