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Conference papers

Power: The New Dimension of Test

Patrick Girard 1
1 SysMIC - Conception et Test de Systèmes MICroélectroniques
LIRMM - Laboratoire d'Informatique de Robotique et de Microélectronique de Montpellier
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https://hal-lirmm.ccsd.cnrs.fr/lirmm-00406964
Contributor : Lionel Torres <>
Submitted on : Thursday, July 23, 2009 - 5:21:01 PM
Last modification on : Wednesday, August 28, 2019 - 3:46:02 PM

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  • HAL Id : lirmm-00406964, version 1

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Patrick Girard. Power: The New Dimension of Test. IEEE Workshop on RTL and High Level Testing, Sapporo, Japan. ⟨lirmm-00406964⟩

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