Conference Papers
Year : 2009
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https://hal-lirmm.ccsd.cnrs.fr/lirmm-00406964
Submitted on : Thursday, July 23, 2009-5:21:01 PM
Last modification on : Friday, March 24, 2023-2:52:52 PM
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- HAL Id : lirmm-00406964 , version 1
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Patrick Girard. Power: The New Dimension of Test. IEEE Workshop on RTL and High Level Testing, Sapporo, Japan. ⟨lirmm-00406964⟩
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