NAND Flash Testing: A Preliminary Study on Actual Defects - LIRMM - Laboratoire d’Informatique, de Robotique et de Microélectronique de Montpellier
Conference Poster Year : 2009

NAND Flash Testing: A Preliminary Study on Actual Defects

Abstract

Embedded flash memories are dominated by the NOR architecture but NAND is becoming more and more adopted due to its high storage capacity. This paper presents a preliminary study on actual defects in NAND array.

Domains

Micro and nanotechnologies/Microelectronics

Arnaud Virazel  : Connect in order to contact the contributor

https://hal-lirmm.ccsd.cnrs.fr/lirmm-00433765

Submitted on : Friday, November 20, 2009-10:42:24 AM

Last modification on : Friday, March 24, 2023-2:52:52 PM

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Dates and versions

lirmm-00433765 , version 1 (20-11-2009)

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Cite

Pierre-Didier Mauroux, Arnaud Virazel, Alberto Bosio, Luigi Dilillo, Patrick Girard, et al.. NAND Flash Testing: A Preliminary Study on Actual Defects. ITC: International Test Conference, Nov 2009, Austin, TX, United States. 2009, ⟨10.1109/TEST.2009.5355898⟩. ⟨lirmm-00433765⟩

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