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Analysis of Power Consumption and Transition Fault Coverage for LOS and LOC Testing Schemes

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https://hal-lirmm.ccsd.cnrs.fr/lirmm-00475734
Contributor : Martine Peridier <>
Submitted on : Thursday, April 22, 2010 - 5:19:32 PM
Last modification on : Wednesday, August 28, 2019 - 3:46:02 PM

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  • HAL Id : lirmm-00475734, version 1

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Wu Fangmei, Luigi Dilillo, Alberto Bosio, Patrick Girard, Serge Pravossoudovitch, et al.. Analysis of Power Consumption and Transition Fault Coverage for LOS and LOC Testing Schemes. DDECS'10: 13th IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems, Apr 2010, Vienna, Austria. pp.376-381. ⟨lirmm-00475734⟩

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