Analysis of Power Consumption and Transition Fault Coverage for LOS and LOC Testing Schemes - LIRMM - Laboratoire d’Informatique, de Robotique et de Microélectronique de Montpellier Access content directly
Conference Papers Year : 2010

Analysis of Power Consumption and Transition Fault Coverage for LOS and LOC Testing Schemes

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Micro and nanotechnologies/Microelectronics

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https://hal-lirmm.ccsd.cnrs.fr/lirmm-00475734

Submitted on : Thursday, April 22, 2010-5:19:32 PM

Last modification on : Friday, March 24, 2023-2:52:53 PM

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lirmm-00475734 , version 1 (22-04-2010)

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  • HAL Id : lirmm-00475734 , version 1

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Wu Fangmei, Luigi Dilillo, Alberto Bosio, Patrick Girard, Serge Pravossoudovitch, et al.. Analysis of Power Consumption and Transition Fault Coverage for LOS and LOC Testing Schemes. DDECS'10: 13th IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems, Apr 2010, Vienna, Austria. pp.376-381. ⟨lirmm-00475734⟩

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