Ensuring High Testability without Degrading Security - LIRMM - Laboratoire d’Informatique, de Robotique et de Microélectronique de Montpellier
Conference Papers Year : 2010

Ensuring High Testability without Degrading Security

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Micro and nanotechnologies/Microelectronics

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https://hal-lirmm.ccsd.cnrs.fr/lirmm-00480710

Submitted on : Tuesday, May 4, 2010-5:30:27 PM

Last modification on : Friday, March 24, 2023-2:52:53 PM

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lirmm-00480710 , version 1 (04-05-2010)

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  • HAL Id : lirmm-00480710 , version 1

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Giorgio Di Natale, Marie-Lise Flottes, Bruno Rouzeyre. Ensuring High Testability without Degrading Security. DDECS'10: IEEE Workshop on Design and Diagnostics of Electronic Circuits and Systems, Vienna, Austria. pp.6. ⟨lirmm-00480710⟩

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