Setting Test Conditions for Improving SRAM Reliability

Abstract : In the context of SRAM testing, we propose a methodology to define proper conditions under which SRAMs should be tested to improve their reliability. This methodology is especially suitable to deal with the impact of threshold voltage variability affecting SRAM core-cell transistors. By establishing an objective manner of comparing different test conditions, the proposed study shows how it is possible to detect SRAM core-cells with poor quality by applying a reduced set of test runs. The proposed methodology also allows determining the most appropriate DfT (Design-for-Test) technique for each peculiar SRAM design and technology.
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Communication dans un congrès
ETS: European Test Symposium, May 2010, Prague, Czech Republic. 15th IEEE European Test Symposium, pp.257-262, 2010
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Soumis le : mercredi 16 juin 2010 - 17:17:27
Dernière modification le : jeudi 24 mai 2018 - 15:59:24
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Renan Alves Fonseca, Luigi Dilillo, Alberto Bosio, Patrick Girard, Serge Pravossoudovitch, et al.. Setting Test Conditions for Improving SRAM Reliability. ETS: European Test Symposium, May 2010, Prague, Czech Republic. 15th IEEE European Test Symposium, pp.257-262, 2010. 〈lirmm-00492741〉

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