B. Cheng, Impact of Random Dopant Fluctuation on Bulk CMOS 6-T SRAM Scaling, 2006 European Solid-State Device Research Conference, pp.258-261, 2006.
DOI : 10.1109/ESSDER.2006.307687

R. and A. Fonseca, Detecting NBTI Induced Failures in SRAM Core-Cells, IEEE VLSI Test Symposium, 2010.
URL : https://hal.archives-ouvertes.fr/lirmm-00553612

M. Sharifkhani, Dynamic Data Stability in SRAM Cells and Its Implications on Data Stability Tests, 2006 IEEE International Workshop on Memory Technology, Design, and Testing (MTDT'06), pp.55-64, 2006.
DOI : 10.1109/MTDT.2006.12