Test and Dependability of Microsystems

Serge Bernard 1 Philippe Cauvet 2
1 SysMIC - Conception et Test de Systèmes MICroélectroniques
LIRMM - Laboratoire d'Informatique de Robotique et de Microélectronique de Montpellier
Abstract : For more than 30 years, the electronics industry has been driven by the development and the exploitation of the permanent shrink in the fabrication processes such as CMOS technologies (nanotechnologies, “More Moore”...). The next steps requiring huge investments, only a few European companies will be able to compete with majors worldwide. But this monolithic approach cannot meet one of the main market needs: more functions in a same chip. Indeed, only the use of heterogeneous technologies (Analog, RF, MEMS) in a single chip is suitable. Fortunately, the micro-systems (SiP, “More than Moore”) approach is now adopted, which permits to propose new solutions and new applications at reasonable costs. In this tutorial, we will at first give an overview of the existing and emerging technologies of micro-systems, illustrated by some typical examples. Although promising, we will subsequently list the major challenges posed by the technologies, from both technical and economical perspectives. Testing being one of the biggest challenges, in a third part, after the IC test techniques will have been reminded, a non-exhaustive list of solutions will be given with illustrations: SiP Test Access Port, loopback test, non-contact test, etc. Before concluding, the presenters will introduce the concept of dependability. Why and in which cases is it important? How can it be reached using test resources?
Type de document :
Communication dans un congrès
DTC'10: European Nanoelectronics Design Technology Conference, Jun 2010, grenoble, France. pp.210-216, 2010
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https://hal-lirmm.ccsd.cnrs.fr/lirmm-00506495
Contributeur : Serge Bernard <>
Soumis le : mercredi 28 juillet 2010 - 01:15:37
Dernière modification le : jeudi 24 mai 2018 - 15:59:24
Document(s) archivé(s) le : vendredi 29 octobre 2010 - 10:30:12

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Serge Bernard, Philippe Cauvet. Test and Dependability of Microsystems. DTC'10: European Nanoelectronics Design Technology Conference, Jun 2010, grenoble, France. pp.210-216, 2010. 〈lirmm-00506495〉

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