Conference Poster
Year : 2010
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https://hal-lirmm.ccsd.cnrs.fr/lirmm-00537849
Submitted on : Friday, November 19, 2010-3:18:23 PM
Last modification on : Friday, March 24, 2023-2:52:53 PM
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- HAL Id : lirmm-00537849 , version 1
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Ziad Noun, Philippe Cauvet, Marie-Lise Flottes, David Andreu, Serge Bernard. Wireless Wafer Test for Iterative Testing During System Assembly. 3D-Test: Testing Three-Dimensional Stacked Integrated Circuits, Nov 2010, Austin, Texas, United States. , 1st IEEE International Workshop on Testing Three-Dimensional Stacked Integrated Circuits, 2010. ⟨lirmm-00537849⟩
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