Wireless Wafer Test for Iterative Testing During System Assembly - LIRMM - Laboratoire d’Informatique, de Robotique et de Microélectronique de Montpellier

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Conference Poster Year : 2010

Wireless Wafer Test for Iterative Testing During System Assembly

(1) , (2) , (3) , (4) , (3)

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Ziad Noun

Function : Author

Laboratoire d'Informatique de Robotique et de Microélectronique de Montpellier

Philippe Cauvet

Function : Author

Ophtimalia

Marie-Lise Flottes

Function : Author
PersonId : 3580
IdHAL : marie-lise-flottes
ORCID : 0000-0002-7231-3976
IdRef : 142992321

Conception et Test de Systèmes MICroélectroniques

David Andreu

Function : Author
PersonId : 8402
IdHAL : david-andreu
ORCID : 0000-0002-0744-9447
IdRef : 121828840

Artificial movement and gait restoration

Serge Bernard

Function : Author
PersonId : 1186
IdHAL : serge-bernard
ORCID : 0000-0003-1772-0592
IdRef : 121569209

Conception et Test de Systèmes MICroélectroniques

Domains

Micro and nanotechnologies/Microelectronics

Martine Peridier : Connect in order to contact the contributor

https://hal-lirmm.ccsd.cnrs.fr/lirmm-00537849

Submitted on : Friday, November 19, 2010-3:18:23 PM

Last modification on : Friday, March 24, 2023-2:52:53 PM

Dates and versions

lirmm-00537849 , version 1 (19-11-2010)

Identifiers

HAL Id : lirmm-00537849 , version 1

Cite

Ziad Noun, Philippe Cauvet, Marie-Lise Flottes, David Andreu, Serge Bernard. Wireless Wafer Test for Iterative Testing During System Assembly. 3D-Test: Testing Three-Dimensional Stacked Integrated Circuits, Nov 2010, Austin, Texas, United States. , 1st IEEE International Workshop on Testing Three-Dimensional Stacked Integrated Circuits, 2010. ⟨lirmm-00537849⟩

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