Conference Poster
Year : 2010
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https://hal-lirmm.ccsd.cnrs.fr/lirmm-00537857
Submitted on : Friday, November 19, 2010-3:29:29 PM
Last modification on : Friday, March 24, 2023-2:52:53 PM
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- HAL Id : lirmm-00537857 , version 1
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Alberto Bosio, Giorgio Di Natale. Parallel Test of Identical Cores Using Test Elevators in 3D Circuits. 3D-Test: Testing Three-Dimensional Stacked Integrated Circuits, Nov 2010, Austin, TX, United States. IEEE, 1st International Workshop on Testing Three-Dimensional Stacked Integrated Circuits, 2010. ⟨lirmm-00537857⟩
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