Is Test Power Reduction Through X-Filling Good Enough?

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Poster communications
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https://hal-lirmm.ccsd.cnrs.fr/lirmm-00537926
Contributor : Martine Peridier <>
Submitted on : Friday, November 19, 2010 - 4:42:45 PM
Last modification on : Wednesday, August 28, 2019 - 3:46:02 PM

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  • HAL Id : lirmm-00537926, version 1

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Fangmei Wu, Luigi Dilillo, Alberto Bosio, Patrick Girard, Serge Pravossoudovitch, et al.. Is Test Power Reduction Through X-Filling Good Enough?. ITC'2010: International Test Conference, Nov 2010, Austin, Texas, United States. 2010. ⟨lirmm-00537926⟩

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