Is Test Power Reduction Through X-Filling Good Enough? - LIRMM - Laboratoire d’Informatique, de Robotique et de Microélectronique de Montpellier
Conference Poster Year : 2010

Is Test Power Reduction Through X-Filling Good Enough?

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Micro and nanotechnologies/Microelectronics

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https://hal-lirmm.ccsd.cnrs.fr/lirmm-00537926

Submitted on : Friday, November 19, 2010-4:42:45 PM

Last modification on : Friday, March 24, 2023-2:52:53 PM

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lirmm-00537926 , version 1 (19-11-2010)

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  • HAL Id : lirmm-00537926 , version 1

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Fangmei Wu, Luigi Dilillo, Alberto Bosio, Patrick Girard, Serge Pravossoudovitch, et al.. Is Test Power Reduction Through X-Filling Good Enough?. ITC'2010: International Test Conference, Nov 2010, Austin, Texas, United States. 2010. ⟨lirmm-00537926⟩

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