Conference Papers
Year : 2010
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https://hal-lirmm.ccsd.cnrs.fr/lirmm-00545102
Submitted on : Thursday, December 9, 2010-3:53:40 PM
Last modification on : Friday, March 24, 2023-2:52:53 PM
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- HAL Id : lirmm-00545102 , version 1
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Paolo Rech, Alberto Bosio, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, et al.. A Memory Fault Simulator for Radiation-Induced Effects in SRAMs. ATS: Asian Test Symposium, 2010, Shanghai, China. pp.100-105. ⟨lirmm-00545102⟩
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