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A Memory Fault Simulator for Radiation-Induced Effects in SRAMs

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https://hal-lirmm.ccsd.cnrs.fr/lirmm-00545102
Contributor : Martine Peridier <>
Submitted on : Thursday, December 9, 2010 - 3:53:40 PM
Last modification on : Friday, November 27, 2020 - 6:04:03 PM

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  • HAL Id : lirmm-00545102, version 1

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Paolo Rech, Alberto Bosio, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, et al.. A Memory Fault Simulator for Radiation-Induced Effects in SRAMs. ATS: Asian Test Symposium, 2010, Shanghai, China. pp.100-105. ⟨lirmm-00545102⟩

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