Impact of Resistive-Bridging Defects in SRAM Core-Cell - LIRMM - Laboratoire d’Informatique, de Robotique et de Microélectronique de Montpellier Access content directly
Conference Papers Year : 2010

Impact of Resistive-Bridging Defects in SRAM Core-Cell

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lirmm-00553592 , version 1 (07-01-2011)

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  • HAL Id : lirmm-00553592 , version 1

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Renan Alves Fonseca, Luigi Dilillo, Alberto Bosio, Patrick Girard, Serge Pravossoudovitch, et al.. Impact of Resistive-Bridging Defects in SRAM Core-Cell. DELTA'10: International Symposium on Electronic Design, Test & Applications, Ho Chi Minh, Vietnam. pp.265-270. ⟨lirmm-00553592⟩
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