Setting Test Conditions for Detecting Faults Induced by Random Dopant Fluctuation in SRAM Core-Cells - LIRMM - Laboratoire d’Informatique, de Robotique et de Microélectronique de Montpellier
Conference Papers Year : 2010

Setting Test Conditions for Detecting Faults Induced by Random Dopant Fluctuation in SRAM Core-Cells

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Micro and nanotechnologies/Microelectronics

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https://hal-lirmm.ccsd.cnrs.fr/lirmm-00553626

Submitted on : Friday, January 7, 2011-4:41:34 PM

Last modification on : Friday, March 24, 2023-2:52:54 PM

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lirmm-00553626 , version 1 (07-01-2011)

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  • HAL Id : lirmm-00553626 , version 1

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Renan Alves Fonseca, Luigi Dilillo, Alberto Bosio, Patrick Girard, Serge Pravossoudovitch, et al.. Setting Test Conditions for Detecting Faults Induced by Random Dopant Fluctuation in SRAM Core-Cells. VARI: Workshop on CMOS Variability, 2010, Montpellier, France. ⟨lirmm-00553626⟩

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