Setting Test Conditions for Detecting Faults Induced by Random Dopant Fluctuation in SRAM Core-Cells

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https://hal-lirmm.ccsd.cnrs.fr/lirmm-00553626
Contributor : Martine Peridier <>
Submitted on : Friday, January 7, 2011 - 4:41:34 PM
Last modification on : Wednesday, August 28, 2019 - 3:46:02 PM

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Renan Alves Fonseca, Luigi Dilillo, Alberto Bosio, Patrick Girard, Serge Pravossoudovitch, et al.. Setting Test Conditions for Detecting Faults Induced by Random Dopant Fluctuation in SRAM Core-Cells. VARI: Workshop on CMOS Variability, 2010, Montpellier, France. ⟨lirmm-00553626⟩

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