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Setting Test Conditions for Detecting Faults Induced by Random Dopant Fluctuation in SRAM Core-Cells

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https://hal-lirmm.ccsd.cnrs.fr/lirmm-00553626
Contributor : Martine Peridier <>
Submitted on : Friday, January 7, 2011 - 4:41:34 PM
Last modification on : Friday, November 27, 2020 - 6:04:03 PM

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  • HAL Id : lirmm-00553626, version 1

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Renan Alves Fonseca, Luigi Dilillo, Alberto Bosio, Patrick Girard, Serge Pravossoudovitch, et al.. Setting Test Conditions for Detecting Faults Induced by Random Dopant Fluctuation in SRAM Core-Cells. VARI: Workshop on CMOS Variability, 2010, Montpellier, France. ⟨lirmm-00553626⟩

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