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Analysis and Fault Modeling of Actual Resistive Defects in Flash Memories

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https://hal-lirmm.ccsd.cnrs.fr/lirmm-00553935
Contributor : Martine Peridier <>
Submitted on : Monday, January 10, 2011 - 11:34:34 AM
Last modification on : Wednesday, August 28, 2019 - 3:46:02 PM

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  • HAL Id : lirmm-00553935, version 1

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Pierre-Didier Mauroux, Arnaud Virazel, Alberto Bosio, Luigi Dilillo, Patrick Girard, et al.. Analysis and Fault Modeling of Actual Resistive Defects in Flash Memories. JNRDM'10 : Journées Nationales du Réseau Doctoral de Microélectronique, Montpellier, France. ⟨lirmm-00553935⟩

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