Analysis and Fault Modeling of Actual Resistive Defects in Flash Memories - LIRMM - Laboratoire d’Informatique, de Robotique et de Microélectronique de Montpellier
Conference Papers Year : 2010

Analysis and Fault Modeling of Actual Resistive Defects in Flash Memories

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Micro and nanotechnologies/Microelectronics

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https://hal-lirmm.ccsd.cnrs.fr/lirmm-00553935

Submitted on : Monday, January 10, 2011-11:34:34 AM

Last modification on : Friday, March 24, 2023-2:52:54 PM

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lirmm-00553935 , version 1 (10-01-2011)

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  • HAL Id : lirmm-00553935 , version 1

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Pierre-Didier Mauroux, Arnaud Virazel, Alberto Bosio, Luigi Dilillo, Patrick Girard, et al.. Analysis and Fault Modeling of Actual Resistive Defects in Flash Memories. JNRDM'10 : Journées Nationales du Réseau Doctoral de Microélectronique, Montpellier, France. ⟨lirmm-00553935⟩

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