Analysis and Fault Modeling of Actual Resistive Defects in Flash Memories
Abstract
N/A
Martine Peridier : Connect in order to contact the contributor
https://hal-lirmm.ccsd.cnrs.fr/lirmm-00553935
Submitted on : Monday, January 10, 2011-11:34:34 AM
Last modification on : Friday, March 24, 2023-2:52:54 PM