Conference Papers Year : 2010

Test Relaxation and X-filling to Reduce Peak Power During At-Speed LOS Testing

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Micro and nanotechnologies/Microelectronics

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https://hal-lirmm.ccsd.cnrs.fr/lirmm-00553989

Submitted on : Monday, January 10, 2011-12:01:25 PM

Last modification on : Tuesday, October 15, 2024-3:03:32 PM

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lirmm-00553989 , version 1 (10-01-2011)

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  • HAL Id : lirmm-00553989 , version 1

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Fangmei Wu, Luigi Dilillo, Alberto Bosio, Patrick Girard, Serge Pravossoudovitch, et al.. Test Relaxation and X-filling to Reduce Peak Power During At-Speed LOS Testing. GDR SOC-SIP'10 : Colloque GDR SoC-SiP, Cergy, France. ⟨lirmm-00553989⟩

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