Tolérance aux fautes et rendement de fabrication - LIRMM - Laboratoire d’Informatique, de Robotique et de Microélectronique de Montpellier Access content directly
Conference Papers Year : 2010

Tolérance aux fautes et rendement de fabrication

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Micro and nanotechnologies/Microelectronics

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https://hal-lirmm.ccsd.cnrs.fr/lirmm-00553995

Submitted on : Monday, January 10, 2011-12:06:25 PM

Last modification on : Friday, March 24, 2023-2:52:54 PM

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lirmm-00553995 , version 1 (10-01-2011)

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  • HAL Id : lirmm-00553995 , version 1

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Ahn Duc Tran, Arnaud Virazel, Alberto Bosio, Luigi Dilillo, Patrick Girard, et al.. Tolérance aux fautes et rendement de fabrication. GDR SOC-SIP'10 : Colloque GDR SoC-SiP, Cergy, France. ⟨lirmm-00553995⟩

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