Conference Papers Year : 2010

Tolérance aux fautes et rendement de fabrication

Abstract

N/A

Domains

Micro and nanotechnologies/Microelectronics

Martine Peridier  : Connect in order to contact the contributor

https://hal-lirmm.ccsd.cnrs.fr/lirmm-00553995

Submitted on : Monday, January 10, 2011-12:06:25 PM

Last modification on : Friday, March 24, 2023-2:52:54 PM

No file

Dates and versions

lirmm-00553995 , version 1 (10-01-2011)

Identifiers

  • HAL Id : lirmm-00553995 , version 1

Cite

Ahn Duc Tran, Arnaud Virazel, Alberto Bosio, Luigi Dilillo, Patrick Girard, et al.. Tolérance aux fautes et rendement de fabrication. GDR SOC-SIP'10 : Colloque GDR SoC-SiP, Cergy, France. ⟨lirmm-00553995⟩

Export

BibTeX XML-TEI Dublin Core DC Terms EndNote DataCite

Collections

CNRS SYSMIC LIRMM LIRMM_MIC MIC MIPS UNIV-MONTPELLIER EC_LYON_STRICT
82 View
0 Download

Share

More