Conference Papers
Year : 2010
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https://hal-lirmm.ccsd.cnrs.fr/lirmm-00566847
Submitted on : Thursday, February 17, 2011-11:21:10 AM
Last modification on : Friday, March 24, 2023-2:52:54 PM
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- HAL Id : lirmm-00566847 , version 1
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Paolo Rech, Jean-Marc J.-M. Galliere, Patrick Girard, Frédéric Wrobel, Frédéric Saigné, et al.. Impact of Resistive-Open Defects on SRAM sensitivity to Soft Errors. RADECS: European Conference on Radiation and Its Effects on Components and Systems, Sep 2010, Langenfeld, Austria. ⟨lirmm-00566847⟩
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