Influence of Parasitic Memory Effect on Single-Cell Faults in SRAMs - LIRMM - Laboratoire d’Informatique, de Robotique et de Microélectronique de Montpellier
Conference Poster Year : 2011

Influence of Parasitic Memory Effect on Single-Cell Faults in SRAMs

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Micro and nanotechnologies/Microelectronics

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https://hal-lirmm.ccsd.cnrs.fr/lirmm-00591995

Submitted on : Tuesday, May 10, 2011-4:43:44 PM

Last modification on : Tuesday, March 26, 2024-5:44:13 PM

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lirmm-00591995 , version 1 (10-05-2011)

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  • HAL Id : lirmm-00591995 , version 1

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Sandra Irobi, Zaid Al-Ars, Said Hamdioui, Michel Renovell. Influence of Parasitic Memory Effect on Single-Cell Faults in SRAMs. DDECS'11: 14th IEEE International Symposium on Design and Diagnostics of Electronic Circuits ans Systems, Germany. pp.159-162, 2011. ⟨lirmm-00591995⟩

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