Pattern Grading for Testing Critical Paths Considering Power Supply Noise and Crosstalk Using a Layout-Aware Quality Metric - LIRMM - Laboratoire d’Informatique, de Robotique et de Microélectronique de Montpellier
Conference Papers Year : 2010

Pattern Grading for Testing Critical Paths Considering Power Supply Noise and Crosstalk Using a Layout-Aware Quality Metric

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Micro and nanotechnologies/Microelectronics

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https://hal-lirmm.ccsd.cnrs.fr/lirmm-00618748

Submitted on : Friday, September 2, 2011-4:47:21 PM

Last modification on : Friday, March 24, 2023-2:52:54 PM

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lirmm-00618748 , version 1 (02-09-2011)

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  • HAL Id : lirmm-00618748 , version 1

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Junxia Ma, Jeremy Lee, Nisar Ahmed, Patrick Girard, Mohammad Tehranipoor. Pattern Grading for Testing Critical Paths Considering Power Supply Noise and Crosstalk Using a Layout-Aware Quality Metric. GLSVLSI'10: IEEE Great Lake Symposium on VLSI, United States. pp.127-130. ⟨lirmm-00618748⟩

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