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Conference Papers Year : 2011

Variability Analysis of an SRAM Test Chip

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Micro and nanotechnologies/Microelectronics

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https://hal-lirmm.ccsd.cnrs.fr/lirmm-00651791

Submitted on : Wednesday, December 14, 2011-11:21:53 AM

Last modification on : Friday, March 24, 2023-2:52:55 PM

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lirmm-00651791 , version 1 (14-12-2011)

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  • HAL Id : lirmm-00651791 , version 1

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Renan Alves Fonseca, Luigi Dilillo, Alberto Bosio, Patrick Girard, Serge Pravossoudovitch, et al.. Variability Analysis of an SRAM Test Chip. ETS: European Test Symposium, May 2011, Trondheim, Norway. ⟨lirmm-00651791⟩

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