Robustness Improvement of Digital Circuits A New Hybrid Fault Tolerant Architecture - LIRMM - Laboratoire d’Informatique, de Robotique et de Microélectronique de Montpellier
Conference Papers Year : 2011

Robustness Improvement of Digital Circuits A New Hybrid Fault Tolerant Architecture

Domains

Micro and nanotechnologies/Microelectronics

Martine Peridier  : Connect in order to contact the contributor

https://hal-lirmm.ccsd.cnrs.fr/lirmm-00679509

Submitted on : Thursday, March 15, 2012-5:22:09 PM

Last modification on : Friday, March 24, 2023-2:52:55 PM

No file

Dates and versions

lirmm-00679509 , version 1 (15-03-2012)

Identifiers

  • HAL Id : lirmm-00679509 , version 1

Cite

Ahn Duc Tran, Arnaud Virazel, Alberto Bosio, Luigi Dilillo, Patrick Girard, et al.. Robustness Improvement of Digital Circuits A New Hybrid Fault Tolerant Architecture. JNRDM'11: Journées Nationales du Réseau Doctoral de Microélectronique, Paris, France. ⟨lirmm-00679509⟩

Export

BibTeX XML-TEI Dublin Core DC Terms EndNote DataCite

Collections

CNRS SYSMIC LIRMM LIRMM_MIC MIC MIPS UNIV-MONTPELLIER EC_LYON_STRICT
87 View
0 Download

Share

More