HAL TEI export of lirmm-00701789 CCSD CC0 1.0 - Universal

HAL API Platform

 A New Bulk Built-in Current Sensor-Based Strategy for Dealing with Long-Duration Transient Faults in Deep-Submicron Technologies Rodrigo Possamai Bastos afb3d3db9872ea43bd579052cbcfc29f univ-grenoble-alpes.fr rpbastos 735900 19797-735900 https://orcid.org/0000-0002-9964-0424 https://www.idref.fr/147702321 Giorgio Di Natale 620536a451678025f4e231fb1ab81d94 univ-grenoble-alpes.fr giorgio-di-natale 9897 23870-9897 https://orcid.org/0000-0001-8063-5388 https://scholar.google.fr/citations?user=TRN1gHMAAAAJ&hl=fr https://www.idref.fr/165791144 Marie-Lise Flottes 66731dffe906565f591b33d6028b314e lirmm.fr marie-lise-flottes 3580 15496-3580 https://www.idref.fr/142992321 https://orcid.org/0000-0002-7231-3976 Bruno Rouzeyre d030dd32f4382ead7280f482feb50d5d lirmm.fr bruno-rouzeyre 22024 15495-22024 https://www.idref.fr/07124705X Rodrigo Possamai Bastos 4c65025d93fed4e5f76709c6e1a98f1f lirmm.fr 2012-05-26 15:29:51 2011-10-04 2025-08-13 03:12:40 2012-07-06 12:47:09 2011-10-03 2012-05-26 contributor Rodrigo Possamai Bastos 4c65025d93fed4e5f76709c6e1a98f1f lirmm.fr CCSD lirmm-00701789 https://hal-lirmm.ccsd.cnrs.fr/lirmm-00701789 possamaibastos:lirmm-00701789 <i>DFT'2011: International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems</i>, Oct 2011, Vancouver, Canada. pp.302-308, <a target="_blank" href="https://dx.doi.org/10.1109/DFT.2011.15">&#x27E8;10.1109/DFT.2011.15&#x27E9;</a> DFT'2011: International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, Oct 2011, Vancouver, Canada. pp.302-308, &#x27E8;10.1109/DFT.2011.15&#x27E9; HAL Authorization CNRS - Centre national de la recherche scientifique SysMic Laboratoire d'Informatique de Robotique et de Microélectronique de Montpellier MIC Département Microélectronique Mathématiques, Informatique, Physique et Systèmes Université de Montpellier Université de Montpellier (2015-2021) International No No Yes Yes A New Bulk Built-in Current Sensor-Based Strategy for Dealing with Long-Duration Transient Faults in Deep-Submicron Technologies Rodrigo Possamai Bastos afb3d3db9872ea43bd579052cbcfc29f univ-grenoble-alpes.fr rpbastos 735900 19797-735900 https://orcid.org/0000-0002-9964-0424 https://www.idref.fr/147702321 Giorgio Di Natale 620536a451678025f4e231fb1ab81d94 univ-grenoble-alpes.fr giorgio-di-natale 9897 23870-9897 https://orcid.org/0000-0001-8063-5388 https://scholar.google.fr/citations?user=TRN1gHMAAAAJ&hl=fr https://www.idref.fr/165791144 Marie-Lise Flottes 66731dffe906565f591b33d6028b314e lirmm.fr marie-lise-flottes 3580 15496-3580 https://www.idref.fr/142992321 https://orcid.org/0000-0002-7231-3976 Bruno Rouzeyre d030dd32f4382ead7280f482feb50d5d lirmm.fr bruno-rouzeyre 22024 15495-22024 https://www.idref.fr/07124705X 978-1-4577-1713-0 DFT'2011: International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems 2011-10-03 2011-10-05 Vancouver Canada IEEE 302-308 2011-12-15 10.1109/DFT.2011.15 http://www.dfts.org/ English soft errors long-duration transient faults fault attacks concurrent error detection schemes Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics Conference papers Conference papers Conference papers

Today's deeply-scaled technology-based integrated circuits are highly sensitive to soft error, tending to be even more in the future. In fact, emerging critical issues are related to transient faults that now can be as long as circuits' clock periods. This work presents a novel improved strategy based on bulk built-in current sensors that is able to cope with long-duration transient faults. Our cost-effective approach is a concurrent error detection scheme with recovery procedure, and rather than existing similar strategy, it has faster correction latency and uses less recovery resources.

 Conception et Test de Systèmes MICroélectroniques SysMIC
http://www.lirmm.fr/recherche/equipes/sysmic 139590827 0000000405990488 199111950H https://ror.org/013yean28 Laboratoire d'Informatique de Robotique et de Microélectronique de Montpellier LIRMM 1995-01-01 2021-12-31
161 rue Ada - 34095 Montpellier
https://www.lirmm.fr 0000000120970141 https://ror.org/051escj72 Université de Montpellier UM 2021-12-31
163 rue Auguste Broussonnet - 34090 Montpellier
http://www.umontpellier.fr/ 02636817X 0000000122597504 https://ror.org/02feahw73 Centre National de la Recherche Scientifique CNRS 1939-10-19
https://www.cnrs.fr/