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 Novel Transient-Fault Detection Circuit Featuring Enhanced Bulk Built-in Current Sensor with Low-Power Sleep Mode Rodrigo Possamai Bastos afb3d3db9872ea43bd579052cbcfc29f univ-grenoble-alpes.fr rpbastos 735900 19797-735900 https://orcid.org/0000-0002-9964-0424 https://www.idref.fr/147702321 Frank Sill Torres 40cca90b5471c7585bb1629a7ab6506e ufmg.br 954578 646677-954578 Giorgio Di Natale 620536a451678025f4e231fb1ab81d94 univ-grenoble-alpes.fr giorgio-di-natale 9897 23870-9897 https://orcid.org/0000-0001-8063-5388 https://scholar.google.fr/citations?user=TRN1gHMAAAAJ&hl=fr https://www.idref.fr/165791144 Marie-Lise Flottes 66731dffe906565f591b33d6028b314e lirmm.fr marie-lise-flottes 3580 15496-3580 https://www.idref.fr/142992321 https://orcid.org/0000-0002-7231-3976 Bruno Rouzeyre d030dd32f4382ead7280f482feb50d5d lirmm.fr bruno-rouzeyre 22024 15495-22024 https://www.idref.fr/07124705X Rodrigo Possamai Bastos 4c65025d93fed4e5f76709c6e1a98f1f lirmm.fr 2012-10-06 07:00:09 2026-02-12 03:25:36 2012-07-09 16:10:48 2012-10-01 2012-10-06 contributor Rodrigo Possamai Bastos 4c65025d93fed4e5f76709c6e1a98f1f lirmm.fr CCSD lirmm-00715117 https://hal-lirmm.ccsd.cnrs.fr/lirmm-00715117 possamaibastos:lirmm-00715117 <i>Microelectronics Reliability</i>, 2012, 52 (9-10), pp.1781-1786. <a target="_blank" href="https://dx.doi.org/10.1016/j.microrel.2012.06.149">&#x27E8;10.1016/j.microrel.2012.06.149&#x27E9;</a> Microelectronics Reliability, 2012, 52 (9-10), pp.1781-1786. &#x27E8;10.1016/j.microrel.2012.06.149&#x27E9; HAL Authorization CNRS - Centre national de la recherche scientifique SysMic Laboratoire d'Informatique de Robotique et de Microélectronique de Montpellier MIC Département Microélectronique Mathématiques, Informatique, Physique et Systèmes Université de Montpellier Université de Montpellier (2015-2021) Special Issue 23rd European Symposium of the Reliability of Electron Devices, Failure Physics and Analysis International No Yes Novel Transient-Fault Detection Circuit Featuring Enhanced Bulk Built-in Current Sensor with Low-Power Sleep Mode Rodrigo Possamai Bastos afb3d3db9872ea43bd579052cbcfc29f univ-grenoble-alpes.fr rpbastos 735900 19797-735900 https://orcid.org/0000-0002-9964-0424 https://www.idref.fr/147702321 Frank Sill Torres 40cca90b5471c7585bb1629a7ab6506e ufmg.br 954578 646677-954578 Giorgio Di Natale 620536a451678025f4e231fb1ab81d94 univ-grenoble-alpes.fr giorgio-di-natale 9897 23870-9897 https://orcid.org/0000-0001-8063-5388 https://scholar.google.fr/citations?user=TRN1gHMAAAAJ&hl=fr https://www.idref.fr/165791144 Marie-Lise Flottes 66731dffe906565f591b33d6028b314e lirmm.fr marie-lise-flottes 3580 15496-3580 https://www.idref.fr/142992321 https://orcid.org/0000-0002-7231-3976 Bruno Rouzeyre d030dd32f4382ead7280f482feb50d5d lirmm.fr bruno-rouzeyre 22024 15495-22024 https://www.idref.fr/07124705X 17084 0026-2714 1872-941X Microelectronics Reliability Elsevier 52 9-10 1781-1786 2012-10-01 10.1016/j.microrel.2012.06.149 English transient-fault... built-in-sensor... PACS 85.42 Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics Journal articles Journal articles Journal articles

This work presents a novel circuit for detecting transient faults in combinational and sequential logic. The detection mechanism features a built-in current sensor connected to the bulks of the monitored logic. The proposed circuit was optimized in terms of power consumption and enhanced with low-power sleep-mode. In addition, a calibration method for bulk built-in current sensors is presented. Overhead results indicate an increase of only 15% in power consumption which represents an improvement of factor 7 compared to similar existing sensors.

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https://ufmg.br/ Conception et Test de Systèmes MICroélectroniques SysMIC
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